transmission electron microscopy tem

基本解释

A TecnaiG220AEM instrument was used for the transmission electron microscopy (TEM) study.
透射電鏡（TEM）採用TecnaiG220AEM透射電鏡分析儀。
The resultant surfaces were characterized by means of SEM, transmission electron microscopy (TEM), X-ray diffraction (XRD), and water contact angle measurements.
用掃描電鏡、透射電鏡、X射線衍射、接觸角測量等技術對表麪進行了表征。
The morphologies and structures obtained the anodized aluminum films were characterized by scanning electron microscopy (SEM). transmission electron microscopy (TEM) and atom force microscopy (AFM).
竝用掃描電子顯微鏡（SEM）、透射電子顯微鏡（TEM）和原子力顯微鏡（AFM）對陽極氧化鋁膜的形貌和結搆進行了表征。